Products: Standard Equipment
GT-PVSCAN 8000
High Speed Optical Scanning
GT-PVSCAN 8000
Optics of GT-PVSCAN 8000
GT-PVSCAN 8000 is a high-speed optical scanning system designed for the characterization of photovoltaic materials and finished cells. It can assist crystal growers in achieving a high-quality (low defect density) material and can help solar cell process engineers develop fabrication processes for higher efficiency devices.
Measurement Modes
- Dislocation density
- Reflectance
- Light Beam Induced Current (LBIC) at two wavelengths
Benefits
- Two wavelengths (λ = 633 nm, λ = 980 nm) for measuring surface and bulk properties.
- Parameters measured as a function of sample position.
- Convenient and easy to read false color maps.
- Provides information related to junction recombination and minority carrier diffusion length.
- PC software control.
- Sample size max. 210 x 210 mm²
- Scan time: 25 min. for 156 x 156 mm² cell at 50 µm step size
- Practical minimum step size: 25 µm
- Camera assisted selection of scan area
Examples of Measurements
Reflectance
LBIC
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Dislocation Density |
